针对新项目的创新及协作式同步项目管理
汽车及交通运输行业
Integration of mechanical, software and electronic systems technologies for vehicle systems
了解行业应用能源与公用事业
Supply chain collaboration in design, construction, maintenance and retirement of mission-critical assets
了解行业应用Heavy Equipment
Construction, mining, and agricultural heavy equipment manufacturers striving for superior performance
Explore Industry工业机械与重型装备行业
Integration of manufacturing process planning with design and engineering for today’s machine complexity
了解行业应用Insurance & Financial
Visibility, compliance and accountability for insurance and financial industries
Explore IndustryMedia & Telecommunications
Siemens PLM Software, a leader in media and telecommunications software, delivers digital solutions for cutting-edge technology supporting complex products in a rapidly changing market.
Explore IndustrySmall & Medium Business
Remove barriers and grow while maintaining your bottom line. We’re democratizing the most robust digital twins for your small and medium businesses.
Explore IndustryDesign for Test | Siemens
Design for Test | Siemens
This course provides a coverage of the most essential digital circuit testing techniques, including practices and automation methods for high-quality low-cost manufacturing test. In addition to fault modeling, test generation and fault simulation, it covers design for testability, built-in self-test for random logic and memory arrays altogether with the newest topics related to embedded test methodologies developed specifically to reduce test data volume, test time, and yield learning.
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This course provides a coverage of the most essential digital circuit testing techniques, including practices and automation methods for high-quality low-cost manufacturing test. In addition to fault modeling, test generation and fault simulation, it covers design for testability, built-in self-test for random logic and memory arrays altogether with the newest topics related to embedded test methodologies developed specifically to reduce test data volume, test time, and yield learning.