Design for Test
This course provides a coverage of the most essential digital circuit testing techniques, including practices and automation methods for high-quality low-cost manufacturing test. In addition to fault modeling, test generation and fault simulation, it covers design for testability, built-in self-test for random logic and memory arrays altogether with the newest topics related to embedded test methodologies developed specifically to reduce test data volume, test time, and yield learning.
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This course provides a coverage of the most essential digital circuit testing techniques, including practices and automation methods for high-quality low-cost manufacturing test. In addition to fault modeling, test generation and fault simulation, it covers design for testability, built-in self-test for random logic and memory arrays altogether with the newest topics related to embedded test methodologies developed specifically to reduce test data volume, test time, and yield learning.
