Learn more about Opcenter Quality
Quality Operations Management for Semiconductor
Integrated quality management ensures consistency across your entire manufacturing process
Ensure end-to-end quality management across your manufacturing process. Focus on prevention to streamline compliance and reduce the cost of quality.
Quality Operations Management for Semiconductor
Ensure end-to-end quality management across your manufacturing process. Focus on prevention to streamline compliance and reduce the cost of quality.
Learn more about quality operations management in Semiconductor manufacturing
AQL-based sampling inspection
AQL-based sampling on lot and die level inspection process supports inspections, including sampling plans and switching rules. This capability provides support for sampling standards such as ANSI Z1.4.
Advanced Sampling Control
Send-ahead wafers are supported within the system to optimize the processing steps and avoid rework of the full lot.
Deviation Management
Deviation management with approval/review path provides:
- Automatic deviation generation based on out-of-the-box business rules or process configured rules
- Manual trigger of deviation at any point in time during or after the process
- Review of the deviations based on approval/review path, with consistent comment entry and electronic signature.
Graphical Defect Entry
Wafer maps (Semi standard E142) provide a graphical method to select defective die and specify the defect.
Pass and Defect Data Collection
Data collections can be defined and enforced as part of an inspection process.
Defects management allows direct assessment of the wafer depending on the wafer and/or lot limits specified in the system. A single source of information allows for detailed analysis over multiple steps in the process flow.
Process quality monitoring
Detailed information on defects and measurements provides online insight on the quality of the products and control process can to ensure product quality.
Real-time limits verification with alerts
This capability provides real-time verification of data point limits with a visual warning if data points are outside of limits. A non-conformance can be triggered if data is outside limits.
SPC and Quality Alarms
Online SPC includes variable charts, attributive charts, and Out of Control Action Plan (OCAP) management for first control loop. Offline SPC enables ad-hoc analysis.
