Innovation et gestion de programmes synchronisée et collaborative pour les nouveaux programmes
Mentor, a Siemens business, today introduced the new Tessent™ software Safety ecosystem – a comprehensive portfolio of best-in-class automotive IC test solutions from Mentor with links to its industry-leading partners. The program helps IC design teams meet the increasingly stringent functional safety requirements of the global automotive industry.
The Tessent Safety ecosystem provides a robust alternative to competing programs, which are based on closed, monolithic, single-source models. Mentor’s open ecosystem approach to IC test functional safety assurance allows chipmakers to combine Mentor’s industry-leading IC test technologies with other best-in-class solutions, enabling more complete, higher performing end-solutions.
“Fast in-system IC test performance is essential to reducing the time between fault detection and engagement of on-chip safety mechanisms,” said Brady Benware, vice president and general manager for the Tessent product family at Mentor, a Siemens business. “To speed IC test performance, automotive IC designers increasingly need all on-chip safety mechanisms, including DFT and non-DFT technologies, to be closely coupled – and this approach is fundamental to Mentor’s new Tessent Safety ecosystem.”
Planned for rapid expansion via partnerships with Mentor’s deep roster of leading partners, the Tessent Safety ecosystem includes:
Among the early adopters of key technologies in Mentor’s Tessent Safety ecosystem is Renesas, which evaluated Mentor’s new Tessent LBIST-OST solution in designing one of its newest automotive processors.
“Leveraging the Observation Scan technology featured in the new Tessent LBIST-OST solution, we were able to reduce the test time for in-system Logic BIST by 5x, thereby enabling a much faster coverage ramp up,” said Hideyuki Okabe, director, Digital Design Technology Department, Shared R&D EDA Division, IoT and Infrastructure Business Unit at Renesas Electronics Corporation. “This enabled us to reduce our Fault Tolerant Time Interval (FTTI) when using Logic BIST as a safety mechanism, and improve the safety response when detecting new defects in our automotive products. We hope to continue to adopt this technology going forward for our automotive products."
The Mentor Tessent products in the Tessent Safety ecosystem are part of the Mentor Safe program, which is one of the industry’s broadest and most comprehensive ISO 26262 qualification programs. For more information about the Mentor Safe program, please visit: https://www.mentor.com/mentor-automotive/functional-safety. More information about Mentor’s Tessent solutions for automotive applications is available at: https://www.mentor.com/products/silicon-yield/automotive, as well as at booth #401 during the 2019 International Test Conference in Washington D.C November 12-14.