LEDs as light sources have revolutionized the lighting world. Their complex, multi-domain operation requires careful characterization to obtain data useful in thermal, electrical, and lighting design. Our Simcenter T3STER thermal characterization hardware and Simcenter TERALED temperature-controlled test stage form combined electrical, thermal, and radiometric/photometric testing station for LEDs and LED modules, creating multi-domain compact models for use in Simcenter thermal design software.
These LED testing solutions conform to JEDEC JESD51-52 and follow CIE technical reports 127:2007 and 225:2017. Real thermal resistance and light output metrics are measured as a function of real LED junction temperature over a wide range of forwarding current. 100% automated, it takes just a few hours while a manual procedure could take more than a day.
Through support for third party spectroradiometers emission spectra can be automatically captured, providing further input for precise modeling of LED package light output properties in lighting design.
Learn More:
Whitepaper: Thermal and Photometric Test and Simulation of LEDS - Automotive example
Delphi4LED: From Measurements to Standardized Multi-Domain Compact Models of LEDs
State of the Art in LED Thermal Characterization
Whitepaper: Testing a high power LED with T3STER & TERALED: Vehicle Foglight Example
Measurement to Standardized Multi-Domain Compact Models of LEDs: Delphi4LED update
