Simcenter T3STER is an advanced non-destructive transient thermal tester for thermal characterization of packaged semiconductor devices (diodes, BJTs, power MOSFETs, IGBTs, power LEDs) and multi-die devices. It measures the true thermal transient response more efficiently than steady-state methods. Measurements are to ±0.01° C with up to 1-microsecond time resolution. Structure functions post-process the response into a plot that shows the thermal resistance and capacitance of package features along the heat flow path. Simcenter T3STER is an ideal pre- and post-stress failure detection tool. The measurements can be exported for thermal model calibration, underpinning the accuracy of the thermal design effort.
Simcenter T3STER
Characterize the thermal properties of components
Simcenter T3STER
Simcenter T3STER is an advanced non-destructive transient thermal tester for thermal characterization of packaged semiconductor devices (diodes, BJTs, power MOSFETs, IGBTs, power LEDs) and multi-die devices. It measures the true thermal transient response more efficiently than steady-state methods. Measurements are to ±0.01° C with up to 1-microsecond time resolution. Structure functions post-process the response into a plot that shows the thermal resistance and capacitance of package features along the heat flow path. Simcenter T3STER is an ideal pre- and post-stress failure detection tool. The measurements can be exported for thermal model calibration, underpinning the accuracy of the thermal design effort.
You may also be interested in...
Event
Realize LIVE Europe: Join the transformation – Registration Now Open!
Realize LIVE Europe returns in person in 2022, uniting the Siemens global user community around a common mission: To co-create a better world.
Event
Realize LIVE Americas: Join the transformation – Registration Now Open!!!
Realize LIVE Americas returns in person in 2022, uniting the Siemens global user community around a common mission: To co-create a better world.
Event
Realize LIVE and User2User – Registration Now Open!!!
You’ll enjoy a wealth of training and education, inspiration and insight - keeping you on the leading edge of digital transformation.
On-Demand Webinar
47 minutes
Semiconductor package thermal characterization – thermal metrics, reliability to quality
Leveraging semiconductor and ic package thermal transient test technology