Model Updating

Optimize correlation between test and FE results after selecting parameters from design sensitivity analysis

LMS Virtual.Lab Model Updating is a model correlation and updating tool that improves simulation model quality based on reference data and helps make models that more closely match reality.

Model sensitivity analysis and updating provides:

  • Easy handling of incompatible geometries when comparing test and FE models
  • Numerical correlation tools such as modal assurance criterion (MAC), orthogonality check and frequency response assurance criterion (FRAC)
  • An easy setup of a dedicated Nastran SOL200 case for design sensitivity calculation
  • Optimization tools

The MAC combined with Nastran® SOL200 sensitivities for mode shapes and eigenfrequencies helps you compute and study MAC and frequency difference sensitivity for mode pair sets. These sensitivities help you obtain the best dynamic match between two models. Model updating can adequately deal with mode switching during the updating process to ensure you use the correct FE shape in correlation with the reference model during the automated updating process.

Model Updating Capabilities

Model Updating provides you with these features:

Model Updating Capabilities
  • Input design parameters for material and element properties
  • Dedicated Nastran SOL200 driver
  • Targets for mass, modal frequencies, MAC and vibration levels
  • MAC, mode pair table and MAC contribution (MACco)
  • FRAC
  • Frequency difference sensitivity and MAC sensitivity
  • DOE (design of experiments), response surface modeling and several optimization algorithms

Model Updating Benefits

Model Updating Benefits

Model Updating helps you:

  • Confirm FE simulation model validity using measurements
  • Identify modeling errors and evaluate modeling strategies
  • Improve FE model reliability with integrated optimization capabilities
  • Identify the cause of modeling errors
  • Define system targets and improve simulation models
  • Improve measurements by defining optimal sensor and excitation device location
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